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All-optical sampling based on TPA in semiconductor microcavity for high-speed OTDM

Abstract : Future high-speed optical communications networks operating at data rates in excess of 100Gbit/s per channel will require a sensitive and ultrafast technique for precise optical signal monitoring. The standard way of characterising high-speed optical signals to use a fast photodetector in conjunction with a high-speed oscilloscope. However, this method is limited to a maximum data rate of approximately 40Gbit/s. An alternative is to employ all-optical sampling techniques based on ultrafast optical nonlinearities present in optical fibres, optical crystals and semiconductors. One such nonlinearity is the optical-to-electrical process of Two-Photon Absorption (TPA) in a semiconductor. This paper presents an optical sampling technique based on TPA in a specially designed semiconductor microcavity. By incorporating the microcavity design, we are able to enhance the TPA efficiency to a level that can be used for high-speed optical sampling.
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https://hal.archives-ouvertes.fr/hal-00022998
Contributor : Sylvain Fève <>
Submitted on : Tuesday, April 18, 2006 - 4:22:10 PM
Last modification on : Tuesday, January 12, 2021 - 4:50:31 PM

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Paul Maguire, Liam Barry, T. Krug, M. Lynch, A.L. Bradley, et al.. All-optical sampling based on TPA in semiconductor microcavity for high-speed OTDM. OPTO-Ireland 2005, Jun 2005, Dublin, Ireland. Vol.5825, pp.316-325, ⟨10.1117/12.604835⟩. ⟨hal-00022998⟩

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