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Evaluation of Fault-tolerant Composite Field AES S-Boxes under Multiple Transient Faults

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https://hal-imt.archives-ouvertes.fr/hal-00973720
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Submitted on : Friday, April 4, 2014 - 2:12:39 PM
Last modification on : Friday, July 31, 2020 - 11:28:08 AM

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  • HAL Id : hal-00973720, version 1

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Ting An, Lirida Alves de Barros Naviner, Philippe Matherat. Evaluation of Fault-tolerant Composite Field AES S-Boxes under Multiple Transient Faults. IEEE International NEWCAS Conference, Jun 2013, Paris, France. pp.1 - 4. ⟨hal-00973720⟩

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