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SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults

Samuel Nascimento Pagliarini 1, 2 Arwa Ben Dhia 1, 2 Lirida Alves de Barros Naviner 1, 2 J. F. Naviner 3
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
2 COMELEC - Département Communications & Electronique
3 LTCI - Laboratoire Traitement et Communication de l'Information
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Journal articles
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https://hal-imt.archives-ouvertes.fr/hal-01062108
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Submitted on : Tuesday, September 9, 2014 - 11:17:39 AM
Last modification on : Tuesday, October 19, 2021 - 11:16:43 AM

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  • HAL Id : hal-01062108, version 1

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INSTITUT-TELECOM | CNRS | PARISTECH | LTCI | SSH | COMELEC

Citation

Samuel Nascimento Pagliarini, Arwa Ben Dhia, Lirida Alves de Barros Naviner, J. F. Naviner. SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults. Microelectronics Reliability, Elsevier, 2013, pp.1230-1234. ⟨hal-01062108⟩

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