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SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults

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https://hal-imt.archives-ouvertes.fr/hal-01062108
Contributor : Admin Télécom Paristech <>
Submitted on : Tuesday, September 9, 2014 - 11:17:39 AM
Last modification on : Wednesday, May 26, 2021 - 5:02:09 PM

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  • HAL Id : hal-01062108, version 1

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Samuel Nascimento Pagliarini, Arwa Ben Dhia, Lirida Alves de Barros Naviner, J. F. Naviner. SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults. Microelectronics Reliability, Elsevier, 2013, pp.1230-1234. ⟨hal-01062108⟩

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