SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults

Complete list of metadatas

https://hal-imt.archives-ouvertes.fr/hal-01062108
Contributor : Admin Télécom Paristech <>
Submitted on : Tuesday, September 9, 2014 - 11:17:39 AM
Last modification on : Wednesday, July 3, 2019 - 10:22:39 AM

Identifiers

  • HAL Id : hal-01062108, version 1

Collections

Citation

Samuel Nascimento Pagliarini, Arwa Ben Dhia, Lirida Alves de Barros Naviner, J. F. Naviner. SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults. Microelectronics Reliability, Elsevier, 2013, pp.1230–1234. ⟨hal-01062108⟩

Share

Metrics

Record views

111