SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults

Samuel Nascimento Pagliarini 1 Arwa Ben Dhia 1 Lirida Alves de Barros Naviner 1 J. F. Naviner 1
1 LTCI - Laboratoire Traitement et Communication de l'Information
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Submitted on : Tuesday, September 9, 2014 - 11:17:39 AM
Last modification on : Wednesday, July 3, 2019 - 10:22:39 AM

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Samuel Nascimento Pagliarini, Arwa Ben Dhia, Lirida Alves de Barros Naviner, J. F. Naviner. SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults. Microelectronics Reliability, Elsevier, 2013, pp.1230–1234. ⟨hal-01062108⟩

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