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Submitted on : Tuesday, September 9, 2014 - 11:17:39 AM Last modification on : Wednesday, September 30, 2020 - 8:54:16 AM
Samuel Nascimento Pagliarini, Arwa Ben Dhia, Lirida Alves de Barros Naviner, J. F. Naviner. SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults. Microelectronics Reliability, 2013, pp.1230-1234. ⟨hal-01062108⟩