Skip to Main content Skip to Navigation
Journal articles

SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults

Samuel Nascimento Pagliarini 1, 2 Arwa Ben Dhia 1, 2 Lirida Alves de Barros Naviner 1, 2 J. F. Naviner 3
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
2 COMELEC - Département Communications & Electronique
3 LTCI - Laboratoire Traitement et Communication de l'Information
Document type :
Journal articles
Complete list of metadatas
https://hal-imt.archives-ouvertes.fr/hal-01062108
Contributor : Admin Télécom Paristech <>
Submitted on : Tuesday, September 9, 2014 - 11:17:39 AM
Last modification on : Wednesday, September 30, 2020 - 8:54:16 AM

Identifiers

  • HAL Id : hal-01062108, version 1

Collections

INSTITUT-TELECOM | CNRS | PARISTECH | LTCI | SSH | COMELEC

Citation

Samuel Nascimento Pagliarini, Arwa Ben Dhia, Lirida Alves de Barros Naviner, J. F. Naviner. SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults. Microelectronics Reliability, 2013, pp.1230-1234. ⟨hal-01062108⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

143