Samuel Nascimento Pagliarini, Arwa Ben Dhia, Lirida Alves de Barros Naviner, J. F. Naviner. Automatic Selective Hardening Against Soft Errors: a Cost-based and Regularity-aware Approach.
IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Sevilla, Spain. pp.753-756.
⟨hal-01062119⟩