Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method

Ting An (1, 2) , Kaikai Liu (1, 2) , Hao Cai (1, 2) , Lirida Alves de Barros Naviner (1, 2)

1 SSH - Secure and Safe Hardware
2 COMELEC - Département Communications & Electronique

Keywords: Concurrent error detection; Multiple faults; Reliability; Radiation-related effects

Domains: Micro and nanotechnologies/Microelectronics; Electronics

Ting An, Kaikai Liu, Hao Cai, Lirida Alves de Barros Naviner. Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method. Microelectronics Reliability, 2015, 55 (3-4), pp.696-703. ⟨hal-01122423⟩