Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method

Ting An 1, 2 Kaikai Liu 1, 2 Hao Cai 1, 2 Lirida Alves de Barros Naviner 1, 2
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
2 COMELEC - Département Communications & Electronique
Keywords : Radiation-related effects Reliability Multiple faults Concurrent error detection
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Journal articles
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https://hal-imt.archives-ouvertes.fr/hal-01122423
Contributor : Admin Télécom Paristech <>
Submitted on : Tuesday, March 3, 2015 - 6:44:02 PM
Last modification on : Thursday, October 17, 2019 - 12:37:03 PM

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  • HAL Id : hal-01122423, version 1

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INSTITUT-TELECOM | PARISTECH | LTCI | UNIV-PARIS-SACLAY | SSH | COMELEC

Citation

Ting An, Kaikai Liu, Hao Cai, Lirida Alves de Barros Naviner. Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method. Microelectronics Reliability, 2015, 55 (3-4), pp.696-703. ⟨hal-01122423⟩

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