Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method

Ting An; Kaikai Liu; Hao Cai; Lirida Alves de Barros Naviner

Journal articles

Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method

Ting An ^{1, 2} Kaikai Liu ^{1, 2} Hao Cai ^{1, 2} Lirida Alves de Barros Naviner ^{1, 2}

1 SSH - Secure and Safe Hardware

LTCI - Laboratoire Traitement et Communication de l'Information

2 COMELEC - Département Communications & Electronique

Keywords : Radiation-related effects Reliability Multiple faults Concurrent error detection

Document type :

Journal articles

Domain :

Engineering Sciences [physics] / Micro and nanotechnologies/Microelectronics

Engineering Sciences [physics] / Electronics

Complete list of metadata

https://hal-imt.archives-ouvertes.fr/hal-01122423
Contributor : Admin Télécom Paristech <>
Submitted on : Tuesday, March 3, 2015 - 6:44:02 PM
Last modification on : Wednesday, May 26, 2021 - 5:02:09 PM

Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method

Identifiers

Collections

Citation

Export

Metrics

260

Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method

Identifiers

Collections

Citation

Export

Share

Metrics

260