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Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method

Ting An 1, 2 Kaikai Liu 1, 2 Hao Cai 1, 2 Lirida Alves de Barros Naviner 1, 2 
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
2 COMELEC - Département Communications & Electronique
Keywords : Concurrent error detection Multiple faults Reliability Radiation-related effects
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Journal articles
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https://hal-imt.archives-ouvertes.fr/hal-01122423
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Submitted on : Tuesday, March 3, 2015 - 6:44:02 PM
Last modification on : Tuesday, October 19, 2021 - 11:16:43 AM

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  • HAL Id : hal-01122423, version 1

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INSTITUT-TELECOM | PARISTECH | LTCI | COMELEC | SSH

Citation

Ting An, Kaikai Liu, Hao Cai, Lirida Alves de Barros Naviner. Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method. Microelectronics Reliability, Elsevier, 2015, 55 (3-4), pp.696-703. ⟨hal-01122423⟩

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