HAL will be down for maintenance from Friday, June 10 at 4pm through Monday, June 13 at 9am. More information
Skip to Main content Skip to Navigation
Journal articles

Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method

Ting An 1, 2 Kaikai Liu 1, 2 Hao Cai 1, 2 Lirida Alves de Barros Naviner 1, 2
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
2 COMELEC - Département Communications & Electronique
Keywords : Radiation-related effects Reliability Multiple faults Concurrent error detection
Document type :
Journal articles
Complete list of metadata
https://hal-imt.archives-ouvertes.fr/hal-01122423
Contributor : Admin Télécom Paristech Connect in order to contact the contributor
Submitted on : Tuesday, March 3, 2015 - 6:44:02 PM
Last modification on : Tuesday, October 19, 2021 - 11:16:43 AM

Identifiers

  • HAL Id : hal-01122423, version 1

Collections

INSTITUT-TELECOM | PARISTECH | LTCI | SSH | COMELEC

Citation

Ting An, Kaikai Liu, Hao Cai, Lirida Alves de Barros Naviner. Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method. Microelectronics Reliability, Elsevier, 2015, 55 (3-4), pp.696-703. ⟨hal-01122423⟩

Export

BibTeX TEI DC DCterms EndNote Datacite

Share

Metrics

Record views

72