Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method

Ting An 1 Kaikai Liu 1 Hao Cai 1 Lirida Alves de Barros Naviner 1
1 LTCI - Laboratoire Traitement et Communication de l'Information
Abstract : ---
Keywords : Concurrent error detection Multiple faults Reliability Radiation-related effects
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Journal articles
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https://hal-imt.archives-ouvertes.fr/hal-01122423
Contributor : Admin Télécom Paristech <>
Submitted on : Tuesday, March 3, 2015 - 6:44:02 PM
Last modification on : Wednesday, July 3, 2019 - 10:22:38 AM

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INSTITUT-TELECOM | PARISTECH | LTCI | UNIV-PARIS-SACLAY | SSH

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Ting An, Kaikai Liu, Hao Cai, Lirida Alves de Barros Naviner. Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method. Microelectronics Reliability, Elsevier, 2015, 55 (3-4), pp.696-703. ⟨hal-01122423⟩

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