Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method

Ting An; Kaikai Liu; Hao Cai; Lirida Alves de Barros Naviner

Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method

Ting An ^{1, 2} Kaikai Liu ^{1, 2} Hao Cai ^{1, 2} Lirida Alves de Barros Naviner ^{1, 2}

1 SSH - Secure and Safe Hardware

LTCI - Laboratoire Traitement et Communication de l'Information

2 COMELEC - Département Communications & Electronique

Keywords : Radiation-related effects Reliability Multiple faults Concurrent error detection

Document type :

Journal articles

Domain :

Engineering Sciences [physics] / Micro and nanotechnologies/Microelectronics

Engineering Sciences [physics] / Electronics

Complete list of metadatas

https://hal-imt.archives-ouvertes.fr/hal-01122423
Contributor : Admin Télécom Paristech <>
Submitted on : Tuesday, March 3, 2015 - 6:44:02 PM
Last modification on : Thursday, October 17, 2019 - 12:37:03 PM

Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method

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Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method

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