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Conference Papers Year : 2015

A Novel Analytical Method for Defect Tolerance Assessment

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Abstract

Due to technology downscaling, defect tolerance analysis has become a major concern in the design of digital circuits. In this paper, we present a novel analytical method that calculates the defect tolerance of logic circuits using probabilistic defect propagation. The proposed method is explained in case of single defect model, but can be easily adapted to handle multiple fault scenarios. The approach manages signal dependencies due to reconvergent fanouts and provides accurate results while keeping linear complexity.
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Dates and versions

hal-01216726 , version 1 (16-10-2015)

Identifiers

  • HAL Id : hal-01216726 , version 1

Cite

Mariem Slimani, Arwa Ben Dhia, Lirida Alves de Barros Naviner. A Novel Analytical Method for Defect Tolerance Assessment. European Symposium on Reliability of Electron devices, Failure physics and Analysis, Oct 2015, Toulouse, France. ⟨hal-01216726⟩
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