Modeling and Characterization of the Uplink and Downlink Exposure in Wireless Networks - IMT - Institut Mines-Télécom Accéder directement au contenu
Article Dans Une Revue International Journal of Antennas and Propagation Année : 2017

Modeling and Characterization of the Uplink and Downlink Exposure in Wireless Networks

Résumé

This paper deals with a new methodology to assess the exposure induced by both uplink and downlink of a cellular network using 3D electromagnetic simulations. It aims to analyze together the exposure induced by a personal device (uplink exposure) and that induced by a base station (downlink exposure). The study involved the major parameters contributing to variability and uncertainty in exposure assessment, such as the user’s posture, the type of wireless device and the propagation environment. Our approach is relying basically on the modeling of the power radiated by the personal device and the ambient electric field, while taking into account the effects of human body shadowing and the propagation channel fluctuations. The exposure assessment as well as the human-wave interactions have been simulated using the finite difference in time domain method (FDTD). In uplink scenarios, four FDTD simulations were performed with a child model, used in two postures (sitting and standing) and in two usage scenarios (voice and data), which aimed to examine the exposure induced by a mobile phone and a tablet emitting, respectively, at 900 MHz and 1940 MHz. In the downlink scenario, a series of FDTD simulations of an exposure to a single plane wave and multi-plane waves have been conducted, and an efficient metamodeling of the exposure using the Polynomial Chaos approach has been developed.

Dates et versions

hal-01552671 , version 1 (03-07-2017)

Identifiants

Citer

A. Krayni, A. Hadjem, G. Vermeeren, Alain Sibille, Christophe Roblin, et al.. Modeling and Characterization of the Uplink and Downlink Exposure in Wireless Networks. International Journal of Antennas and Propagation, 2017, pp.1-15. ⟨10.1155/2017/8243490⟩. ⟨hal-01552671⟩
165 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More