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hal-01062073v1  Conference papers
Arwa Ben Dhia. A Defect-tolerant Cluster in a Mesh SRAM-based FPGA
International Conference on Field-Programmable Technology (ICFPT), Dec 2013, Kyoto, Japan. pp.434-437
hal-01062064v1  Conference papers
Mariem SlimaniArwa Ben DhiaNaviner Lirida. Cross Logic : A New Approach for Defect-Tolerant Circuits
IEEE International Conference on IC Design and Technology (ICICDT), May 2014, Austin, United States. pp.1-4
hal-01216729v1  Journal articles
Mariem SlimaniArwa Ben DhiaNaviner Lirida. A Novel Analytical Method for Defect Tolerance Assessment
Microelectronics Reliability Journal, 2015, 55, pp.1285-1289
hal-01062075v1  Conference papers
Arwa Ben DhiaSamuel Nascimento PagliariniNaviner LiridaHabib MehrezPhilippe Matherat. A defect-tolerant area-efficient multiplexer for basic blocks in SRAM-based FPGAs
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2013, Arcachon, France. pp.1189-1193
hal-01062119v1  Conference papers
Samuel Nascimento PagliariniArwa Ben DhiaNaviner LiridaJ. F. Naviner. Automatic Selective Hardening Against Soft Errors: a Cost-based and Regularity-aware Approach
IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Sevilla, Spain. pp.753-756
hal-01062059v1  Conference papers
Arwa Ben DhiaMariem SlimaniNaviner Lirida. Comparative Study of Defect-Tolerant Multiplexers for FPGAs
20th IEEE International On-Line Testing Symposium (IOLTS), Jul 2014, Platja d'Aro, Spain. pp.7-12
hal-01062063v1  Conference papers
Arwa Ben DhiaMariem SlimaniNaviner Lirida. A Defect-Tolerant Multiplexer Using Differential Logic for FPGAs
IEEE 21st Mixed Design of Integrated Circuits and Systems Conference (MIXDES), Jun 2014, Lublin, Poland. pp.375-380
hal-01128326v1  Journal articles
Arwa Ben DhiaMariem SlimaniHao CaiNaviner Lirida. A dual-rail compact defect-tolerant multiplexer
Microelectronics Reliability Journal, 2015, 55, pp.662-670
hal-01062112v1  Conference papers
Arwa Ben DhiaNaviner LiridaPhilippe Matherat. Comparison of Fault-Tolerant Fabless CLBs in SRAM-based FPGAs
IEEE Latin-American Test Workshop (LATW), Apr 2013, Cordoba, Argentina. pp.1-6
hal-01062799v1  Conference papers
Arwa Ben DhiaNaviner LiridaP. Matherat. Analyzing and Alleviating the Impact of Errors on an SRAM-based FPGA Cluster
IEEE International On-Line Testing Symposium (IOLTS), Jun 2012, Sitges, Spain. pp.31-36
hal-01062078v1  Conference papers
Samuel Nascimento PagliariniArwa Ben DhiaNaviner LiridaJ. F. Naviner. SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2013, Arcachon, France. pp.1230-1234
hal-01216726v1  Conference papers
Mariem SlimaniArwa Ben DhiaNaviner Lirida. A Novel Analytical Method for Defect Tolerance Assessment
European Symposium on Reliability of Electron devices, Failure physics and Analysis, Oct 2015, Toulouse, France
hal-01062101v1  Conference papers
Arwa Ben DhiaNaviner LiridaPhilippe Matherat. Evaluating CLB Designs under Multiple SETs in SRAM-based FPGAs
IEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New-York City, United States. pp.112-117
hal-02411877v1  Conference papers
Arwa Ben DhiaNaviner LiridaP. Matherat. Tolérance aux défauts dans les FPGAs
Journées Nationales du Réseau Doctoral de Microélectronique (JNRDM), Jun 2012, Marseille, France
hal-01062066v1  Conference papers
Arwa Ben DhiaMariem SlimaniNaviner Lirida. Improving the Robustness of a Switch Box in a Mesh of Clusters FPGA
15th IEEE Latin American Test Workshop (LATW), Mar 2014, Fortaleza, Brazil. pp.1-6
hal-01062116v1  Conference papers
Arwa Ben DhiaNaviner LiridaP. Matherat. A New Fault-Tolerant Architecture for CLBs in SRAM-based FPGAs
IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Sevilla, Spain. pp.761-764
hal-02288374v1  Conference papers
Arwa Ben DhiaNaviner LiridaPhilippe Matherat. Nouvelle architecture de BLE tolérante aux fautes dans les FPGAs SRAM
Journées Nationales du Réseau Doctoral de Microélectronique (JNRDM), Jun 2013, Grenoble, France
hal-01400630v1  Conference papers
Saif-Ur RehmanAdrien BlanchardonArwa Ben DhiaMounir BenabdenbiRoselyne Chotin et al.  Impact of Cluster Size on Routability, Testability and Robustness of a Cluster in a Mesh FPGA
IEEE Computer Society Annual Symposium on VLSI (ISVLSI'14), Jul 2014, Tampa, FL, United States. pp.553-558, ⟨10.1109/ISVLSI.2014.66⟩
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hal-00987365v1  Conference papers
Arwa Ben DhiaSaif Ur RehmanAdrien BlanchardonNaviner LiridaMounir Benabdenbi et al.  A Defect-tolerant Cluster in a Mesh SRAM-based FPGA
International Conference on Field-Programmable Technology (FPT), Dec 2013, Kyoto, Japan. pp.434-437, ⟨10.1109/FPT.2013.6718407⟩