Samuel Nascimento Pagliarini, Arwa Ben Dhia, Lirida Alves de Barros Naviner, J. F. Naviner. SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults.
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2013, Arcachon, France. pp.1230-1234.
⟨hal-01062078⟩