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Conference Papers Year : 2013

SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults

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Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics

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https://hal-imt.archives-ouvertes.fr/hal-01062078

Submitted on : Tuesday, September 9, 2014-10:50:37 AM

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hal-01062078 , version 1 (09-09-2014)

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  • HAL Id : hal-01062078 , version 1

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Samuel Nascimento Pagliarini, Arwa Ben Dhia, Lirida Alves de Barros Naviner, J. F. Naviner. SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults. European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2013, Arcachon, France. pp.1230-1234. ⟨hal-01062078⟩

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