 |
Archives Ouvertes : HAL - IMT |  |
Conference papers
SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults
Samuel Nascimento Pagliarini
1, 2
Arwa Ben Dhia
1, 2
Lirida Alves de Barros Naviner
1, 2
J. F. Naviner
3
Samuel Nascimento Pagliarini 1, 2
Author
Arwa Ben Dhia 1, 2
Author
Lirida Alves de Barros Naviner 1, 2
Author IdHAL : lirida-naviner
J. F. Naviner 3
Author
1
SSH - Secure and Safe Hardware (Télécom Paris 19 Place Marguerite Perey 91120 Palaiseau - France)
- LTCI - Laboratoire Traitement et Communication de l'Information (Télécom Paris 19 Place Marguerite Perey 91120 PALAISEAU - France)
- IMT - Institut Mines-Télécom [Paris] (37-39 Rue Dareau, 75014 Paris - France)
- Télécom Paris (19 Place Marguerite Perey 91120 Palaiseau - France)
2
COMELEC - Département Communications & Electronique (46, rue Barrault
75013 Paris - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
3
LTCI - Laboratoire Traitement et Communication de l'Information (46 rue Barrault F-75634 Paris Cedex 13 - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
- IMT - Institut Mines-Télécom [Paris] (37-39 Rue Dareau, 75014 Paris - France)
- CNRS - Centre National de la Recherche Scientifique : UMR5141 (France)
Document type :
Conference papers
Complete list of metadata
https://hal-imt.archives-ouvertes.fr/hal-01062078
Contributor : Admin Télécom Paristech Connect in order to contact the contributor
Submitted on : Tuesday, September 9, 2014 - 10:50:37 AM
Last modification on : Tuesday, October 19, 2021 - 11:16:43 AM
Contributor : Admin Télécom Paristech Connect in order to contact the contributor
Submitted on : Tuesday, September 9, 2014 - 10:50:37 AM
Last modification on : Tuesday, October 19, 2021 - 11:16:43 AM
Identifiers
- HAL Id : hal-01062078, version 1
Citation
Samuel Nascimento Pagliarini, Arwa Ben Dhia, Lirida Alves de Barros Naviner, J. F. Naviner. SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults. European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2013, Arcachon, France. pp.1230-1234. ⟨hal-01062078⟩
Metrics
Record views