SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults

Samuel Nascimento Pagliarini 1 Arwa Ben Dhia 1 Lirida Alves de Barros Naviner 1 J. F. Naviner 1
1 LTCI - Laboratoire Traitement et Communication de l'Information
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Conference papers
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https://hal-imt.archives-ouvertes.fr/hal-01062078
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Submitted on : Tuesday, September 9, 2014 - 10:50:37 AM
Last modification on : Wednesday, July 3, 2019 - 10:22:39 AM

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Samuel Nascimento Pagliarini, Arwa Ben Dhia, Lirida Alves de Barros Naviner, J. F. Naviner. SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults. European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2013, Arcachon, France. pp.1230–1234. ⟨hal-01062078⟩

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