Conference Papers
Year : 2013
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https://hal-imt.archives-ouvertes.fr/hal-01062078
Submitted on : Tuesday, September 9, 2014-10:50:37 AM
Last modification on : Sunday, April 2, 2023-10:30:07 AM
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- HAL Id : hal-01062078 , version 1
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Samuel Nascimento Pagliarini, Arwa Ben Dhia, Lirida Alves de Barros Naviner, J. F. Naviner. SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults. European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2013, Arcachon, France. pp.1230-1234. ⟨hal-01062078⟩
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